Investigation of Polymer Phase Behavior at Heterogeneous Polymer-Polymer Interfaces using Secondary Ion Mass Spectrometry.

Please use this identifier to cite or link to this item: http://www.lib.ncsu.edu/resolver/1840.16/4055

Title:	Investigation of Polymer Phase Behavior at Heterogeneous Polymer-Polymer Interfaces using Secondary Ion Mass Spectrometry.
Authors:	Harton, Shane Edward
Advisors:	Dieter P. Griffis, Committee Member Bruce M. Novak, Committee Member Robert J. Nemanich, Committee Member Phillip E. Russell, Committee Co-Chair Harald Ade, Committee Chair
Keywords:	depth profiling secondary ion mass spectrometry thermodynamics polymer films
Issue Date:	7-Mar-2006
Degree:	PhD
Discipline:	Materials Science and Engineering
Abstract:	Changes in the thermodynamic behavior of polymer blends from bulk to heterogeneous interfaces is investigated using secondary ion mass spectrometry (SIMS). The use of a magnetic sector spectrometer (CAMECA IMS-6f) is fully explored in order to determine the optimal conditions in which to probe polymer surfaces and heterogeneous interfaces using three bilayer film systems, namely polystyrene (PS) with poly(methyl methacrylate) (PMMA), poly(cyclohexyl methacrylate) (PCHMA) with PMMA, and PS with poly(2-vinylpyridine) (P2VP). Two primary ion beams have been employed, O2+ with detection of positive secondary ions, and Cs+ with detection of negative secondary ions. It was found that each polymer thin film system must be closely investigated in order to determine the optimal conditions for depth profiling using SIMS. Three types of systems were further investigated using SIMS.
URI:	http://www.lib.ncsu.edu/resolver/1840.16/4055
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