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Please use this identifier to cite or link to this item:
http://www.lib.ncsu.edu/resolver/1840.16/4454
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| Title: | High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes |
| Authors: | Progl, Curtis Lorenz |
| Advisors: | Phillip E. Russell, Committee Chair Gerd J. Duscher, Committee Member Mark A. Johnson, Committee Member Carl M. Osburn, Committee Member |
| Keywords: | GaN MQW LEDs STEM EBIC CL V-defects |
| Issue Date: | 23-Apr-2008 |
| Degree: | PhD |
| Discipline: | Materials Science and Engineering |
| Abstract: | |
| URI: | http://www.lib.ncsu.edu/resolver/1840.16/4454 |
| Appears in Collections: | Dissertations
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