NCSU Institutional Repository >
NC State Theses and Dissertations >
Theses >

Please use this identifier to cite or link to this item:

Title: Investigation of Thermal Stability of 600V/1200V Shottky & JBS SiC Rectifiers Under High Temperature Operation and Degradation Mechanism Under Continuous DC Stress.
Authors: Jiang, Jiadi
Advisors: Alex Huang, Chair
B. Baliga, Member
Mesut Baran, Member
Issue Date: 16-Aug-2011
Degree: Master of Science
Discipline: Electrical Engineering
Appears in Collections:Theses

Files in This Item:

File Description SizeFormat
etd.pdf1.6 MBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.