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Please use this identifier to cite or link to this item: http://www.lib.ncsu.edu/resolver/1840.16/7340

Title: Investigation of Thermal Stability of 600V/1200V Shottky & JBS SiC Rectifiers Under High Temperature Operation and Degradation Mechanism Under Continuous DC Stress.
Authors: Jiang, Jiadi
Advisors: Alex Huang, Chair
B. Baliga, Member
Mesut Baran, Member
Issue Date: 16-Aug-2011
Degree: Master of Science
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/7340
Appears in Collections:Theses

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