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Please use this identifier to cite or link to this item: http://www.lib.ncsu.edu/resolver/1840.16/7975

Title: Performance and Reliability Modeling of AlGaN/GaN Hetero-junction Field Effect Transistors.
Authors: Schimizzi, Ryan
Advisors: Robert Trew, Chair
Griff Bilbro, Co-Chair
Brian Floyd, Member
Zhilin Li, Member
Issue Date: 2-Jul-2012
Degree: Doctor of Philosophy
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/7975
Appears in Collections:Dissertations

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