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Please use this identifier to cite or link to this item: http://www.lib.ncsu.edu/resolver/1840.16/8989

Title: Modeling Layout Dependent Stress Effects for CMOS.
Authors: Demircioglu, Harun
Advisors: William Davis, Chair
Paul Franzon, Member
Mehmet Ozturk, Member
Naihuan Jing, Member
Issue Date: 30-Sep-2013
Degree: Doctor of Philosophy
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/8989
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