High resolution X-ray Diffraction Characterization of III-Nitride Semiconductors: Bulk Crystals and Thin Films.

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Title: High resolution X-ray Diffraction Characterization of III-Nitride Semiconductors: Bulk Crystals and Thin Films.
Author: Bobea, Milena Rebeca
Advisors: Zlatko Sitar, Co-Chair
Ramon Collazo, Co-Chair
Subhashish Bhattacharya, Member
Nadia El-Masry, Member
Date: 2015-09-04
Degree: Doctor of Philosophy
Discipline: Material Science & Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/10735


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