Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy.

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Title: Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy.
Author: Oni, Adedapo Adesoji
Advisors: James LeBeau, Chair
Ronald Scattergood, Member
Douglas Irving, Member
Korukonda Murty, Member
Elizabeth Dickey, Member
Date: 2015-12-09
Degree: Doctor of Philosophy
Discipline: Material Science & Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/10870


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