Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy.

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dc.contributor.advisor James LeBeau, Chair en_US
dc.contributor.advisor Ronald Scattergood, Member en_US
dc.contributor.advisor Douglas Irving, Member en_US
dc.contributor.advisor Korukonda Murty, Member en_US
dc.contributor.advisor Elizabeth Dickey, Member en_US
dc.contributor.author Oni, Adedapo Adesoji en_US
dc.date.accessioned 2016-02-03T10:01:57Z
dc.date.available 2016-02-03T10:01:57Z
dc.date.issued 2015-12-09 en_US
dc.date.submitted 2016-01-01 en_US
dc.identifier.other deg4896 en_US
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.16/10870
dc.rights en_US
dc.title Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy. en_US
dc.degree.name Doctor of Philosophy en_US
dc.degree.level dissertation en_US
dc.degree.discipline Material Science & Engineering en_US
dc.date.accepted 2016-02-01 en_US
dc.date.defense 2015-12-09 en_US
dc.date.released 2016-02-03 en_US
dc.date.reviewed 2016-01-19 en_US


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