Electronic Defect Characterization of Strained-Si/SiGe/Si Heterostructure

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Title: Electronic Defect Characterization of Strained-Si/SiGe/Si Heterostructure
Author: Zhang, Renhua
Advisors: George A. Rozgonyi, Committee Chair
Carl M. Osburn, Committee Member
Phillip Russell, Committee Member
Gerd Duscher, Committee Member
Abstract:
Date: 2007-08-22
Degree: PhD
Discipline: Materials Science and Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/3076


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