High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes

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Title: High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes
Author: Progl, Curtis Lorenz
Advisors: Phillip E. Russell, Committee Chair
Gerd J. Duscher, Committee Member
Mark A. Johnson, Committee Member
Carl M. Osburn, Committee Member
Abstract:
Date: 2008-04-23
Degree: PhD
Discipline: Materials Science and Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/4454


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