High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes
| Title: | High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes |
| Author: | Progl, Curtis Lorenz |
| Advisors: | Phillip E. Russell, Committee Chair Gerd J. Duscher, Committee Member Mark A. Johnson, Committee Member Carl M. Osburn, Committee Member |
| Abstract: | |
| Date: | 2008-04-23 |
| Degree: | PhD |
| Discipline: | Materials Science and Engineering |
| URI: | http://www.lib.ncsu.edu/resolver/1840.16/4454 |
Files in this item
| Files | Size | Format | View |
|---|---|---|---|
| etd.pdf | 8.285Mb |
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