Variability and Reliability in Nanoscale Circuits: Simulation, Design, Monitoring, and Characterization.

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Title: Variability and Reliability in Nanoscale Circuits: Simulation, Design, Monitoring, and Characterization.
Author: Yelten, Mustafa
Advisors: Michael Steer, Chair
Paul Franzon, Co-Chair
Mo-Yuen Chow, Member
Joseph Tracy, Minor
Date: 2011-08-02
Degree: Doctor of Philosophy
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/7252


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