Investigation of Thermal Stability of 600V/1200V Shottky & JBS SiC Rectifiers Under High Temperature Operation and Degradation Mechanism Under Continuous DC Stress.

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Title: Investigation of Thermal Stability of 600V/1200V Shottky & JBS SiC Rectifiers Under High Temperature Operation and Degradation Mechanism Under Continuous DC Stress.
Author: Jiang, Jiadi
Advisors: Alex Huang, Chair
B. Baliga, Member
Mesut Baran, Member
Date: 2011-08-16
Degree: Master of Science
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/7340


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