Resistivity and Defect-induced Lifetime Variations in Gallium-doped Continuous Czochralski Grown Silicon.

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Title: Resistivity and Defect-induced Lifetime Variations in Gallium-doped Continuous Czochralski Grown Silicon.
Author: Yan, Yixin
Advisors: George Rozgonyi, Chair
Mehmet Ozturk, Minor
Linyou Cao, Member
Date: 2012-06-08
Degree: Master of Science
Discipline: Materials Science and Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/7826


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