Performance and Reliability Modeling of AlGaN/GaN Hetero-junction Field Effect Transistors.

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Title: Performance and Reliability Modeling of AlGaN/GaN Hetero-junction Field Effect Transistors.
Author: Schimizzi, Ryan
Advisors: Robert Trew, Chair
Griff Bilbro, Co-Chair
Brian Floyd, Member
Zhilin Li, Member
Date: 2012-07-02
Degree: Doctor of Philosophy
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/7975


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