Measurement and Control of In-plane Surface Chemistry at the Si/SiO2 Interface.

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Title: Measurement and Control of In-plane Surface Chemistry at the Si/SiO2 Interface.
Author: Gokce, Bilal
Advisors: Kenan Gundogdu, Chair
Gerald Lucovsky, Member
David Aspnes, Member
Salah M. Bedair, Member
Date: 2012-09-11
Degree: Doctor of Philosophy
Discipline: Physics
URI: http://www.lib.ncsu.edu/resolver/1840.16/8091


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