X-ray Characterization and Defect Control of III-Nitrides.
| Title: | X-ray Characterization and Defect Control of III-Nitrides. |
| Author: | Tweedie, James Scott |
| Advisors: | Zlatko Sitar, Chair Ramon Collazo, Member Jon-Paul Maria, Member Anatoli Melechko, Member |
| Date: | 2012-06-27 |
| Degree: | Doctor of Philosophy |
| Discipline: | Materials Science and Engineering |
| URI: | http://www.lib.ncsu.edu/resolver/1840.16/8187 |
Files in this item
| Files | Size | Format | View |
|---|---|---|---|
| etd.pdf | 2.333Mb |
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