X-ray Characterization and Defect Control of III-Nitrides.

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Title: X-ray Characterization and Defect Control of III-Nitrides.
Author: Tweedie, James Scott
Advisors: Zlatko Sitar, Chair
Ramon Collazo, Member
Jon-Paul Maria, Member
Anatoli Melechko, Member
Date: 2012-06-27
Degree: Doctor of Philosophy
Discipline: Materials Science and Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/8187


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