X-ray Characterization and Defect Control of III-Nitrides.

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dc.contributor.advisor Zlatko Sitar, Chair en_US
dc.contributor.advisor Ramon Collazo, Member en_US
dc.contributor.advisor Jon-Paul Maria, Member en_US
dc.contributor.advisor Anatoli Melechko, Member en_US
dc.contributor.author Tweedie, James Scott en_US
dc.date.accessioned 2012-11-28T06:32:22Z
dc.date.available 2012-11-28T06:32:22Z
dc.date.issued 2012-06-27 en_US
dc.date.submitted 2012-08-15 en_US
dc.identifier.other deg2034 en_US
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.16/8187
dc.title X-ray Characterization and Defect Control of III-Nitrides. en_US
dc.degree.name Doctor of Philosophy en_US
dc.degree.level dissertation en_US
dc.degree.discipline Materials Science and Engineering en_US
dc.date.accepted 2012-11-26 en_US
dc.date.defense 2012-06-27 en_US
dc.date.released 2012-11-28 en_US
dc.date.reviewed 2012-08-17 en_US

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