dc.contributor.advisor |
Zlatko Sitar, Chair |
en_US |
dc.contributor.advisor |
Ramon Collazo, Member |
en_US |
dc.contributor.advisor |
Jon-Paul Maria, Member |
en_US |
dc.contributor.advisor |
Anatoli Melechko, Member |
en_US |
dc.contributor.author |
Tweedie, James Scott |
en_US |
dc.date.accessioned |
2012-11-28T06:32:22Z |
|
dc.date.available |
2012-11-28T06:32:22Z |
|
dc.date.issued |
2012-06-27 |
en_US |
dc.date.submitted |
2012-08-15 |
en_US |
dc.identifier.other |
deg2034 |
en_US |
dc.identifier.uri |
http://www.lib.ncsu.edu/resolver/1840.16/8187 |
|
dc.title |
X-ray Characterization and Defect Control of III-Nitrides. |
en_US |
dc.degree.name |
Doctor of Philosophy |
en_US |
dc.degree.level |
dissertation |
en_US |
dc.degree.discipline |
Materials Science and Engineering |
en_US |
dc.date.accepted |
2012-11-26 |
en_US |
dc.date.defense |
2012-06-27 |
en_US |
dc.date.released |
2012-11-28 |
en_US |
dc.date.reviewed |
2012-08-17 |
en_US |