Characterization of the Effect of Radiation Damage on the Thin-Film Stress Behavior of Nanocrystalline 3C SiC.

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Title: Characterization of the Effect of Radiation Damage on the Thin-Film Stress Behavior of Nanocrystalline 3C SiC.
Author: Hardiman, Christopher M
Advisors: Steven Shannon, Chair
Jon-Paul Maria, Minor
Jacob Eapen, Member
Date: 2013-04-26
Degree: Master of Science
Discipline: Nuclear Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/8841


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