Modeling Layout Dependent Stress Effects for CMOS.

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Title: Modeling Layout Dependent Stress Effects for CMOS.
Author: Demircioglu, Harun
Advisors: William Davis, Chair
Paul Franzon, Member
Mehmet Ozturk, Member
Naihuan Jing, Member
Date: 2013-09-30
Degree: Doctor of Philosophy
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.16/8989


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