Method for determining interface properties of semiconductor materials by photoreflectance

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Title: Method for determining interface properties of semiconductor materials by photoreflectance
Date: 1993
Citation: Pollack, F. H., Shen, H. E., & Lucovsky, G. (1993). Method for determining interface properties of semiconductor materials by photoreflectance. U.S. Patent No. 5,255,070. Washington, DC: U.S. Patent and Trademark Office.
URI: http://www.lib.ncsu.edu/resolver/1840.2/1365


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