Method for determining interface properties of semiconductor materials by photoreflectance
| Title: | Method for determining interface properties of semiconductor materials by photoreflectance |
| Date: | 1993 |
| Citation: | Pollack, F. H., Shen, H. E., & Lucovsky, G. (1993). Method for determining interface properties of semiconductor materials by photoreflectance. U.S. Patent No. 5,255,070. Washington, DC: U.S. Patent and Trademark Office. |
| URI: | http://www.lib.ncsu.edu/resolver/1840.2/1365 |
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