Method for determining interface properties of semiconductor materials by photoreflectance
No Thumbnail Available
Date
1993
Authors
Advisors
Journal Title
Series/Report No.
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Citation
Pollack, F. H., Shen, H. E., & Lucovsky, G. (1993). Method for determining interface properties of semiconductor materials by photoreflectance. U.S. Patent No. 5,255,070. Washington, DC: U.S. Patent and Trademark Office.