Measurement of thin films by polarized light
Title: | Measurement of thin films by polarized light |
Date: | 1976 |
Citation: | Aspnes, D. E. (1976). Measurement of thin films by polarized light. U.S. Patent No. 3,985,447. Washington, DC: U.S. Patent and Trademark Office. |
URI: | http://www.lib.ncsu.edu/resolver/1840.2/1459 |
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