Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation

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Title: Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation
Date: 2002
Citation: Glinka, Y. D., Wang, W., Singh, S. K., Marka, Z., Rashkeev, S. N., Shirokaya, Y., Albridge, R., Pantelides, S. T., Tolk, N. H., & Lucovsky, G. (2002). Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation. Physical review. B, Condensed matter and materials physics, 65(19), 193103-1.
URI: http://www.lib.ncsu.edu/resolver/1840.2/223


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