Cathodoluminescence measurements of suboxide band-tail and Si dangling bond states at ultrathin Si-SiO2 interfaces

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dc.date.accessioned 2008-02-22T23:13:46Z
dc.date.available 2008-02-22T23:13:46Z
dc.date.issued 1998
dc.identifier.citation Young, A. P., Schafer, J., Jessen, G. H., Bandhu, R., Brillson, L. J., Lucovsky, G., & Niimi, H. (1998). Cathodoluminescence measurements of suboxide band-tail and Si dangling bond states at ultrathin Si-SiO2 interfaces. Journal of vacuum science & technology. B, Microelectronics and nanometer structures, 16(4), 2177-2181.
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.2/250
dc.format.extent 108167 bytes
dc.format.mimetype application/pdf
dc.language.iso en
dc.title Cathodoluminescence measurements of suboxide band-tail and Si dangling bond states at ultrathin Si-SiO2 interfaces
dc.type Article


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