Spectroscopic characterization of high k dielectrics: Applications to interface electronic structure and stability against chemical phase separation

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Title: Spectroscopic characterization of high k dielectrics: Applications to interface electronic structure and stability against chemical phase separation
Date: 2004
Citation: Krug, C., & Lucovsky, G. (2004). Spectroscopic characterization of high k dielectrics: Applications to interface electronic structure and stability against chemical phase separation. Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 22(4), 1301-1308.
URI: http://www.lib.ncsu.edu/resolver/1840.2/252


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