Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys

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Title: Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys
Date: 2000
Citation: Lucovsky, G., & Rayner, G. B. (2000). Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys. Applied physics letters, 77(18), 2912-2914.
URI: http://www.lib.ncsu.edu/resolver/1840.2/278


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