Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)

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2003

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Cook, T. E., Fulton, C. C., Mecouch, W. J., Tracy, K. M., Davis, R. F., Hurt, E. H., Lucovsky, G., & Nemanich, R. J. (2003). Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001). Journal of applied physics, 93(7), 3995-4004.

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