Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)

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Title:	Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)
Date:	2003
Citation:	Cook, T. E., Fulton, C. C., Mecouch, W. J., Tracy, K. M., Davis, R. F., Hurt, E. H., Lucovsky, G., & Nemanich, R. J. (2003). Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001). Journal of applied physics, 93(7), 3995-4004.
URI:	http://www.lib.ncsu.edu/resolver/1840.2/410



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