Variation of GaN valence bands with biaxial stress and quantification of residual stress
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2001
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Edwards, N. V., Bremser, M. D., Weeks, T. W., Nam, O. H., Davis, R. F., Liu, H., Stall, R. A., Horton, M. N., Perkins, N. R., Kuech, T. F., Yoo, S. D., & Aspnes, D. E. (1997). Variation of GaN valence bands with biaxial stress and quantification of residual stress. Applied physics letters, 70(1997), 2001.
