Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC

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Title: Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC
Date: 2003
Citation: Schwarz, U. T., Schuck, P. J., Mason, M. D., Grober, R. D., Roskowski, A. M., Einfeldt, S., & Davis, R. F. (2003). Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC. Physical review. B, Condensed matter and materials physics, 67(4), 045321-1.
URI: http://www.lib.ncsu.edu/resolver/1840.2/604


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