Systems and methods for using diffraction patterns to determine radiation intensity values for areas between and along adjacent sensors of compound sensor arrays

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dc.date.accessioned 2008-07-21T19:09:16Z
dc.date.available 2008-07-21T19:09:16Z
dc.date.issued 2000
dc.identifier.citation Bilbro, G. L., Snyder, W. E., & Zilic, A. (2000). Systems and methods for using diffraction patterns to determine radiation intensity values for areas between and along adjacent sensors of compound sensor arrays. U.S. Patent No. 6,021,241. Washington, DC: U.S. Patent and Trademark Office.
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.2/814
dc.format.extent 56424 bytes
dc.format.mimetype application/pdf
dc.language.iso en
dc.title Systems and methods for using diffraction patterns to determine radiation intensity values for areas between and along adjacent sensors of compound sensor arrays
dc.type Patent


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