In-situ Scanning Electron Microscopy Mechanical Characterization of Crystalline Nanowires using MEMS Devices.

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Title: In-situ Scanning Electron Microscopy Mechanical Characterization of Crystalline Nanowires using MEMS Devices.
Author: Chang, Tzu-Hsuan
Advisors: Yong Zhu, Chair
Chih-Hao Chang, Member
Mark Pankow, Member
Joseph Tracy, Member
Joseph Tracy, Graduate School Representative
Date: 2016-08-15
Degree: Doctor of Philosophy
Discipline: Mechanical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.20/34775


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