Dynamic Characterization and Failure Analysis of the 1200V, 10A Silicon Carbide JBSFET.
| Title: | Dynamic Characterization and Failure Analysis of the 1200V, 10A Silicon Carbide JBSFET. |
| Author: | Kanale, Ajit R |
| Advisors: | Subhashish Bhattacharya, Co-Chair B. Baliga, Co-Chair Douglas Hopkins, Member |
| Date: | 2018-11-30 |
| Degree: | Master of Science |
| Discipline: | Electrical Engineering |
| URI: | http://www.lib.ncsu.edu/resolver/1840.20/36569 |
Files in this item
| Files | Size | Format | View |
|---|---|---|---|
| etd.pdf | 3.279Mb |
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