Dynamic Characterization and Failure Analysis of the 1200V, 10A Silicon Carbide JBSFET.

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Title: Dynamic Characterization and Failure Analysis of the 1200V, 10A Silicon Carbide JBSFET.
Author: Kanale, Ajit R
Advisors: Subhashish Bhattacharya, Co-Chair
B. Baliga, Co-Chair
Douglas Hopkins, Member
Date: 2018-11-30
Degree: Master of Science
Discipline: Electrical Engineering
URI: http://www.lib.ncsu.edu/resolver/1840.20/36569


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