Dynamic Characterization and Failure Analysis of the 1200V, 10A Silicon Carbide JBSFET.
Title: | Dynamic Characterization and Failure Analysis of the 1200V, 10A Silicon Carbide JBSFET. |
Author: | Kanale, Ajit R |
Advisors: | Subhashish Bhattacharya, Co-Chair B. Baliga, Co-Chair Douglas Hopkins, Member |
Date: | 2018-11-30 |
Degree: | Master of Science |
Discipline: | Electrical Engineering |
URI: | http://www.lib.ncsu.edu/resolver/1840.20/36569 |
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