Design of a Full Power Test System for Semiconductor Switching Characterization.

Show full item record

Title: Design of a Full Power Test System for Semiconductor Switching Characterization.
Author: Murthy, Pranav Rajashekhara
Advisors: Douglas Hopkins, Chair
Wensong Yu, Member
Subhashish Bhattacharya, Member
Date: 2021-01-15
Degree: Master of Science
Discipline: Electrical Engineering
URI: https://www.lib.ncsu.edu/resolver/1840.20/38780


Files in this item

Files Size Format View
etd.pdf 3.523Mb PDF View/Open

This item appears in the following Collection(s)

Show full item record