Adaptation of a CMOS Reliability Simulation Model for the Open Model Interface.

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Title: Adaptation of a CMOS Reliability Simulation Model for the Open Model Interface.
Author: Colebaugh, Sarah Kathleen
Advisors: William Davis, Chair
Yaoyao Jia, Member
David Ricketts, Member
Date: 2021-03-30
Degree: Master of Science
Discipline: Electrical Engineering
URI: https://www.lib.ncsu.edu/resolver/1840.20/38794


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