Data-Driven Condition Monitoring and Defect Detection in Electron-Beam Additive Manufacturing.

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Title: Data-Driven Condition Monitoring and Defect Detection in Electron-Beam Additive Manufacturing.
Author: Jeong, Jahoon
Advisors: Xiaolei Fang, Chair
Dan Harris, Minor
Ola Lars Harrysson, Member
Date: 2021-05-11
Degree: Master of Science
Discipline: Industrial Engineering
URI: https://www.lib.ncsu.edu/resolver/1840.20/38874


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