Modeling, Testing, and Fault Masking in CMOS Networks

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Title: Modeling, Testing, and Fault Masking in CMOS Networks
Author: Al-Arian, Sami Amin
Advisors: Dharma P. Agrawal, Chair
J. B. O'Neal, Jr.
Professor Chou
Date: 1985
Degree: Doctor of Philosophy
Discipline: Electrical and Computer Engineering
URI: https://www.lib.ncsu.edu/resolver/1840.20/40725


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