Measure Specific Dynamic Importance Sampling for Availability Simulations

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dc.contributor.author Goyal, Ambuj
dc.contributor.author Heidelberger, Philip
dc.contributor.author Shahabuddin, Perwez
dc.date.accessioned 2012-01-12T18:47:09Z
dc.date.available 2012-01-12T18:47:09Z
dc.date.issued 1987
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.4/5569
dc.format.extent 431615 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso en
dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseries Winter Simulation Conference Proceedings
dc.title Measure Specific Dynamic Importance Sampling for Availability Simulations
dc.type Technical report


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