An Importance Sampling Scheme for Simulating the Degradation and Failure of Complex Systems During Finite Missions

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dc.contributor.author Kioussis, Leonidas C.
dc.contributor.author Miller, Douglas R.
dc.date.accessioned 2012-01-12T18:49:06Z
dc.date.available 2012-01-12T18:49:06Z
dc.date.issued 1983
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.4/6191
dc.format.extent 571568 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso en
dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseries Winter Simulation Conference Proceedings
dc.title An Importance Sampling Scheme for Simulating the Degradation and Failure of Complex Systems During Finite Missions
dc.type Technical report


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