The Application of Experimental Design to the Analysis of Semiconductor Manufacturing Lines

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Title: The Application of Experimental Design to the Analysis of Semiconductor Manufacturing Lines
Author: Wood, Sarah J.; Welch, Peter D.
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 1990
Series/Report No.: Winter Simulation Conference Proceedings
URI: http://www.lib.ncsu.edu/resolver/1840.4/6301


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