Validation of Trace-Driven Simulation Models: Regression Analysis Revisited

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Title: Validation of Trace-Driven Simulation Models: Regression Analysis Revisited
Author: Kleijnen, Jack P. C.; Bettonvil, Bert; Van Groenendaal, Willem
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 1996
Series/Report No.: Winter Simulation Conference Proceedings
URI: http://www.lib.ncsu.edu/resolver/1840.4/6544


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