The Effects of Batching on the Power of the Test for Frequency Domain Methodology

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dc.contributor.author Morrice, Douglas J.
dc.date.accessioned 2012-01-12T18:50:21Z
dc.date.available 2012-01-12T18:50:21Z
dc.date.issued 1991
dc.identifier.uri http://www.lib.ncsu.edu/resolver/1840.4/6568
dc.format.extent 610355 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso en
dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseries Winter Simulation Conference Proceedings
dc.title The Effects of Batching on the Power of the Test for Frequency Domain Methodology
dc.type Technical report


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