The Generation of Confidence Intervals for Steady State Simulations Through the Application of Spectral Analysis

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Title: The Generation of Confidence Intervals for Steady State Simulations Through the Application of Spectral Analysis
Author: Welch, Peter D.
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 1983
Series/Report No.: Winter Simulation Conference Proceedings
URI: http://www.lib.ncsu.edu/resolver/1840.4/7825


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