Dielectrics and Interface Engineering for Silicon Carbide Metal Oxide Semiconductor Field Effect Transistors.

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dc.contributor.advisorVeena Misra, Chairen_US
dc.contributor.advisorJohn Muth, Memberen_US
dc.contributor.advisorAlex Huang, Memberen_US
dc.contributor.advisorElizabeth Dickey, Minoren_US
dc.contributor.authorYang, Xiangyuen_US
dc.date.accepted2015-04-22en_US
dc.date.accessioned2016-04-24T12:31:43Z
dc.date.available2016-04-24T12:31:43Z
dc.date.defense2014-12-03en_US
dc.date.embargo2016-04-24en_US
dc.date.issued2014-12-03en_US
dc.date.released2016-04-24en_US
dc.date.reviewed2014-12-12en_US
dc.date.submitted2014-12-04en_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.identifier.otherdeg3987en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/11114
dc.rightsen_US
dc.titleDielectrics and Interface Engineering for Silicon Carbide Metal Oxide Semiconductor Field Effect Transistors.en_US

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