Systems and methods for using diffraction patterns to determine radiation intensity values for areas between and along adjacent sensors of compound sensor arrays
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2000
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Bilbro, G. L., Snyder, W. E., & Zilic, A. (2000). Systems and methods for using diffraction patterns to determine radiation intensity values for areas between and along adjacent sensors of compound sensor arrays. U.S. Patent No. 6,021,241. Washington, DC: U.S. Patent and Trademark Office.
