Junction-Level Thermal Analysis of Three Dimensional Integrated Circuits.

dc.contributor.advisorWilliam Davis, Chairen_US
dc.contributor.advisorPaul Franzon, Memberen_US
dc.contributor.advisorMichael Steer, Memberen_US
dc.contributor.advisorDonald Bitzer, Memberen_US
dc.contributor.authorMelamed, Samsonen_US
dc.date.accepted2011-06-29en_US
dc.date.accessioned2011-07-01T07:00:16Z
dc.date.available2011-07-01T07:00:16Z
dc.date.defense2011-04-29en_US
dc.date.issued2011-04-29en_US
dc.date.released2011-07-01en_US
dc.date.reviewed2011-05-06en_US
dc.date.submitted2011-04-29en_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.identifier.otherdeg807en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/6977
dc.rightsen_US
dc.titleJunction-Level Thermal Analysis of Three Dimensional Integrated Circuits.en_US

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