Measure Specific Dynamic Importance Sampling for Availability Simulations

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dc.contributor.authorGoyal, Ambuj
dc.contributor.authorHeidelberger, Philip
dc.contributor.authorShahabuddin, Perwez
dc.date.accessioned2012-01-12T18:47:09Z
dc.date.available2012-01-12T18:47:09Z
dc.date.issued1987
dc.format.extent431615 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/5569
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleMeasure Specific Dynamic Importance Sampling for Availability Simulations
dc.typeTechnical report

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