Structural Characterization of III-Nitride Semiconductors: Defect Control and Strain Management.

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dc.contributor.advisorZlatko Sitar, Co-Chair
dc.contributor.advisorRamon Collazo, Co-Chair
dc.contributor.advisorWenpei Gao, Member
dc.contributor.advisorLeda Lunardi, Member
dc.contributor.authorGuan, Yan
dc.date.accepted2022-03-21
dc.date.accessioned2022-03-23T12:30:22Z
dc.date.available2022-03-23T12:30:22Z
dc.date.defense2022-01-07
dc.date.issued2022-01-07
dc.date.released2022-03-23
dc.date.reviewed2022-01-11
dc.date.submitted2022-01-07
dc.degree.disciplineMaterial Science & Engineering
dc.degree.leveldissertation
dc.degree.nameDoctor of Philosophy
dc.identifier.otherdeg28185
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/39442
dc.titleStructural Characterization of III-Nitride Semiconductors: Defect Control and Strain Management.

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