Measurement of thin films by polarized light

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dc.date.accessioned2008-10-14T17:56:26Z
dc.date.available2008-10-14T17:56:26Z
dc.date.issued1976
dc.format.extent117123 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationAspnes, D. E. (1976). Measurement of thin films by polarized light. U.S. Patent No. 3,985,447. Washington, DC: U.S. Patent and Trademark Office.
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.2/1459
dc.language.isoen
dc.titleMeasurement of thin films by polarized light
dc.typePatent

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