Sequential Bayesian Analysis of Simulation Experiments

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dc.contributor.authorHaddock, Jorge
dc.contributor.authorWillemain, Thomas R.
dc.date.accessioned2012-01-12T18:53:14Z
dc.date.available2012-01-12T18:53:14Z
dc.date.issued1990
dc.format.extent718765 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/7478
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleSequential Bayesian Analysis of Simulation Experiments
dc.typeTechnical report

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