Understanding Structure-Property Relation of Complex Oxide Interfaces Using Synchrotron X-Ray Diffraction.

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dc.contributor.advisorDivine Kumah, Chair
dc.contributor.advisorDali Sun, Member
dc.contributor.advisorAlexander Kemper, Member
dc.contributor.advisorJacob Jones, Member
dc.contributor.authorChen, Tongjie
dc.date.accepted2021-08-09
dc.date.accessioned2021-12-08T13:30:12Z
dc.date.available2021-12-08T13:30:12Z
dc.date.defense2021-07-28
dc.date.issued2021-07-28
dc.date.released2021-12-08
dc.date.reviewed2021-08-03
dc.date.submitted2021-08-02
dc.degree.disciplinePhysics
dc.degree.leveldissertation
dc.degree.nameDoctor of Philosophy
dc.identifier.otherdeg26497
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/39333
dc.titleUnderstanding Structure-Property Relation of Complex Oxide Interfaces Using Synchrotron X-Ray Diffraction.

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